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dc.contributor.author Tari, S.
dc.contributor.author Aqariden, F.
dc.contributor.author Chang, Y.
dc.contributor.author Ciani, A.
dc.contributor.author Grein, C.
dc.contributor.author Li, Jin
dc.contributor.author Kioussis, N.
dc.date.accessioned 2017-09-12T00:03:40Z
dc.date.available 2017-09-12T00:03:40Z
dc.date.issued 2014
dc.identifier.citation Tari, S., Aqariden, F., Chang, Y., Ciani, A., Grein, C., Li, J., & Kioussis, N. (2014). Structural and Electronic Properties of Gold Contacts on CdZnTe with Different Surface Finishes for Radiation Detector Applications. Journal of Electronic Materials, 43(8), 2978–2983. https://doi.org/10.1007/s11664-014-3167-5 en_US
dc.identifier.issn 0361-5235
dc.identifier.uri http://hdl.handle.net/10211.3/195971
dc.description.abstract State-of-the-art room-temperature, high-resolution x-ray and gamma-ray semiconductor detectors can be fabricated from CdZnTe (CZT) crystals. The structural and electronic properties of the CZT surface, especially the contact interfaces, can have a substantial effect on radiation detector performance, for example leakage current, signal-to-noise ratio, and energy resolution, especially for soft x-rays and large pixilated arrays. Atomically smooth and defect-free surfaces are desirable for high-performance CZT-based detectors; chemo-mechanical polishing (CMP) is typically performed to produce such surfaces. The electrical behavior of the metal/CZT interface varies substantially with surface preparation before contact deposition, and with choice of metal and deposition technique. We report a systematic study of the structural and electronic properties of gold (Au) contacts on CZT prepared with different surface finishes. We observed subsurface damage under Au contacts on CMP-finished CZT and abrupt interfaces for Au on chemically-polished (CP) CZT. Schottky barrier formation was observed for Au contacts, irrespective of surface finish, and less charge trapping and low surface resistance were observed for CP-finished surfaces. Pre-deposition surface treatment produced interfaces free from oxide layers. en_US
dc.format.extent 6 en_US
dc.language.iso en en_US
dc.publisher Journal of Electronic Materials en_US
dc.relation.uri https://www.researchgate.net/profile/Yong_Chang6/publication/271973080_Structural_and_Electronic_Properties_of_Gold_Contacts_on_CdZnTe_with_Different_Surface_Finishes_for_Radiation_Detector_Applications/links/55e4c59d08aecb1a7ccb8a53.pdf en_US
dc.rights copyright 2014 TMS en_US
dc.subject CZT en_US
dc.subject radiation detector en_US
dc.subject polishing en_US
dc.subject leakage current en_US
dc.subject XPS en_US
dc.subject metal contacts en_US
dc.subject ohmic en_US
dc.title Structural and Electronic Properties of Gold Contacts on CdZnTe with Different Surface Finishes for Radiation Detector Applications en_US
dc.type Article en_US


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